Optimum Constant-stress Partially Accelerated Life Tests for the Truncated Logistic Distribution under Time Constraint

This paper presents an optimum design of constant-stress partially accelerated life test (PALT) plan in which each item runs either at use or accelerated condition and product life follows Truncated Logistic distribution truncated at point zero under type-I censoring. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. The optimal sample proportion allocated to both normal use condition and accelerated condition for the constant PALT is determined by minimizing the generalized asymptotic variance of MLEs of the acceleration factor and model parameters (Doptimality criterion). The method developed has been illustrated using an example. Sensitivity analysis and comparative study has also been carried out.